No.	Analysis	Description	Model
1	Carbon, Hydrogen, Nitrogen, & Sulphur Elemental Analyzer	We analyze the elemental composition of samples for carbon, hydrogen, nitrogen, and sulfur. This involves quantifying the amounts of these elements present in various types of samples using analytical techniques such as elemental analysis or combustion analysis. These measurements are crucial for understanding the chemical composition and properties of the materials being studied.	ELEMENTAR
2	Surface Area And Pore Analyzer	We analyze the microstructural properties of solids and powders. This includes studying characteristics such as particle size, shape, morphology, crystal structure, porosity, surface area, and any defects or imperfections present in the material.	Thermo Scientific
3	Temperature-Programmed Desorption, Oxidation, Reduction And Pulse Chemisorption Analyzer	We conduct various analyses including pulse chemisorption, temperature-programmed reduction (TPR), desorption (TPD), oxidation (TPO), and reaction studies. These methods help us determine catalytic properties such as metal dispersion percentage, active metal surface area, acid strength, surface acidity, and the distribution of active site strengths among others.	Micromeritics
4	X-Ray Photoelectron Spectroscopy (Xps)	X-Ray Photoelectron Spectroscopy (XPS) is a quantitative analysis technique that reveals the elemental composition (excluding hydrogen) and details about chemical bonding environments and oxidation states within the upper 1-10 nm of a material's surface. This method is highly valuable for studying surface chemistry and understanding the composition of thin films, coatings, and surfaces of various materials.	Thermo Scientific
5	X-Ray Diffractometer (Xrd)	X-ray diffraction is used to determine the atomic and molecular structure of a crystal by analyzing the diffraction pattern produced when a beam of X-rays interacts with the regularly spaced atoms in the crystal lattice. This diffraction pattern consists of specific angles at which the X-rays are scattered due to constructive interference, providing valuable information about the arrangement of atoms within the crystal lattice, including their spacing and orientation.
6	Inductively Coupled Plasma Triple Quadrupole Mass Spectrometer (Icp-Ms/Ms)	An Inductively Coupled Plasma Triple Quadrupole Mass Spectrometer (ICP-MS/MS) is a highly sensitive and versatile analytical instrument used to detect and quantify trace elements in various environmental samples.
7	CO2 Adsorption Test	To determine the CO2 adsorption capacity (mmol/g) of a power sample (adsorbent)
8	Field-Emission Scanning Electron Microscope (Fe-Sem)	A FESEM is used to visualize very small topographic details on the surface or entire or fractioned objects.	Hitachi SU8020
9	Inductively Coupled Plasma Optical Emission Spectrometer (Icp-Oes)	An Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES) is a powerful analytical instrument used to determine the elemental composition of various environmental samples.
10	HIGH RESOLUTION – TRANSMISSION ELECTRON MICROSCOPE 200KV  (HR-TEM 200 KV)	The JEM-ARM200F is an Atomic Resolution Microscope (ARM) that allows for atom-by-atom imaging and exceptional spatial resolution for atom-to-atom chemical mapping of materials. It includes capabilities for EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy).	JEOL JEM-ARM 200F